| Spie Annual Meeting 2003: Advanced Metrology (Proceedings of Spie) |  | Publisher: Society of Photo Optical
Category: Book
Buy New: $300.00
as of 2/6/2012 14:22 PST details
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Seller: Amazon.com
Languages: English (Unknown), English (Original Language), English (Published)
Media: Hardcover
Edition: Cdr
ISBN: 081945107X
EAN: 9780819451071
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